作者:
作者单位:
刊名:The Refractories Engineer
ISSN:1362-4547
出版年:2011-01-05
卷:
期:1
起页:8
止页:8
分类号:TQ175.7
语种:英文
关键词:
内容简介CERAM, a global expert in materials testing, analysis and consultancy, has extended the scope of its microstructural and mineralogical analysis services with the acquisition of a new X-Ray Diffractometer (XRD). The state-of-the-art XRD system provides faster analysis turnaround, increased resolution, non-powder sample analysis and improved Rietveld refinement, as well as three new techniques: X-Ray Reflectivity (XRR); Grazing Incidence XRD (GIXRD); and Micro-Diffraction (m-XRD).
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