作者:Cornuz, M.;Gr?tzel, M.;Sivula, K.;
作者单位:Institut des Sciences et Ingénierie Chimiques, ?cole Polytechnique Fédérale, Lausanne CH-1015 Lausanne, Switzerland;Institut des Sciences et Ingénierie Chimiques, ?cole Polytechnique Fédérale, Lausanne CH-1015 Lausanne, Switzerland;Institut des Sciences e
刊名:Chemical vapor deposition
ISSN:0948-1907
出版年:2010-01-05
卷:16
期:41194
起页:291
止页:295
分类号:TQ175
语种:英文
关键词:
内容简介The state-of-the-art performance, obtained through the reduction of precursor gas residence time in hematite photoanodes produced by APCVD, is explained in this report by an enhanced preferential orientation of the highly conductive crystal planes perpendicular to the electron-collecting substrate.
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