作者：TOMIKATSU KUBO;

作者单位：Tomikatsu Kubo, Rigaku Corporation, 14-8, Akaoji-cho, Takatsuki-shi, Osaka 569-1146

刊名：Journal of the Technical Association of Refractories

ISSN：0285-0028

出版年：2003-01-05

卷：23

期：2

起页：112

止页：118

分类号：TQ175

语种：英文

关键词：

内容简介

Because of the various analysis techniques, and the application of the computer and software, there has been rapid progress in recent years, with successful development of new measurement equipment and methods in the field of x-ray diffraction, although the theory and principal of the method has remained the same. By applying these new techniques, it is now possible to obtain experimental results and make good evaluations, even for problems that in the past required experience-based judgment, and could only be evaluated qualitatively. In cases where quantitative numerical calculations are possible, it is frequently used for indexing quality control. Because there are a lot of topics and materials which were not possible to consider in past experiments and analyses, the author recommends consulting with the equipment manufacturers and research companies, that are involved in the frontier technologies, and not to give up on the difficult material evaluation questions and needs.